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Items where Laboratory is "Laboratoire de Microscopie en Champ Proche - LMCP (Montpellier, France)"

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Article

Riedel, C. and Arinero, R. and Tordjeman, Ph. and Ramonda, Michel and Lévêque, G. and Schwartz, G. A. and de Oteyza, D. G. and Alegría, A. and Colmenero, J. Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. (2010) The European Physical Journal Applied Physics, vol. 50 (n° 1). pp. 10501 1-10501 8. ISSN 1286-0042

Book Section

Arinero, R. and Riedel, C. and Schwartz, G.A. and Lévêque, G. and Alegria, A. and Tordjeman, Ph. and Israeloff, N.E. and Ramonda, M. and Colmenero, J. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2

This list was generated on Thu Jul 31 11:52:49 2014 CEST.