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Items where Laboratory is "Laboratoire de Microscopie en Champ Proche - LMCP (Montpellier, France)"

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Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Ramonda, Michel and Lévêque, Gérard and Schwartz, Gustavo Ariel and de Oteyza, D. G. and Alegría, Angel and Colmenero, Juan Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. (2010) The European Physical Journal Applied Physics, vol. 50 (n° 1). pp. 10501 1-10501 8. ISSN 1286-0042

Arinero, Richard and Riedel, Clément and Schwartz, Gustavo Ariel and Lévêque, Gérard and Alegría, Angel and Tordjeman, Philippe and Israeloff, N. E. and Ramonda, Michel and Colmenero, Juan Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2

This list was generated on Thu Nov 27 04:12:41 2014 CET.