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Items where Laboratory is "Institut d'Electronique du Sud - IES (Montpellier, France)"

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Number of items: 7.

Article

Riedel, Clément and Sweeney, R. and Israeloff, N. E. and Arinero, Richard and Schwartz, Gustavo Ariel and Alegría, Angel and Tordjeman, Philippe and Colmenero, Juan Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy. (2010) Applied Physics Letters, vol. 96 (n° 21). ISSN 0003-6951

Riedel, Clément and Alegría, Angel and Tordjeman, Philippe and Colmenero, Juan High and low molecular weight crossovers in the longest relaxation time dependence of linear cis-1,4 polyisoprene by dielectric relaxations. (2010) Rheologica Acta, vol. 49 (n° 5). pp. 507-512. ISSN 0035-4511

Riedel, Clément and Schwartz, Gustavo Ariel and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Alegría, Angel and Colmenero, Juan Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images. (2010) Ultramicroscopy, vol. 110 (n° 6). pp. 634-638. ISSN 0304-3991

Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Ramonda, Michel and Lévêque, Gérard and Schwartz, Gustavo Ariel and de Oteyza, D. G. and Alegría, Angel and Colmenero, Juan Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. (2010) The European Physical Journal Applied Physics, vol. 50 (n° 1). pp. 10501 1-10501 8. ISSN 1286-0042

Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Schwartz, Gustavo Ariel and Alegría, Angel and Colmenero, Juan Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy. (2010) Physical Review E, vol. 81 (n° 1). ISSN 1539-3755

Chinaud, Maxime and Delaunay, Thomas and Tordjeman, Philippe An experimental study of particle sedimentation using ultrasonic speckle velocimetry. (2010) Measurement Science and Technology, vol. 21 (n° 5). ISSN 0957-0233

Book Section

Arinero, Richard and Riedel, Clément and Schwartz, Gustavo Ariel and Lévêque, Gérard and Alegría, Angel and Tordjeman, Philippe and Israeloff, N. E. and Ramonda, Michel and Colmenero, Juan Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2

This list was generated on Thu Nov 27 04:14:54 2014 CET.