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Items where Laboratory is "Institut d'Electronique du Sud - IES (Montpellier, France)"

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Number of items: 7.

Riedel, Clément and Sweeney, R. and Israeloff, N. E. and Arinero, Richard and Schwartz, Gustavo Ariel and Alegría, Angel and Tordjeman, Philippe and Colmenero, Juan Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy. (2010) Applied Physics Letters, vol. 96 (n° 21). ISSN 0003-6951

Riedel, Clément and Alegría, Angel and Tordjeman, Philippe and Colmenero, Juan High and low molecular weight crossovers in the longest relaxation time dependence of linear cis-1,4 polyisoprene by dielectric relaxations. (2010) Rheologica Acta, vol. 49 (n° 5). pp. 507-512. ISSN 0035-4511

Riedel, C. and Schwartz, Gustavo Ariel and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Alegría, Angel and Colmenero, Juan Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images. (2010) Ultramicroscopy, vol. 110 (n° 6). pp. 634-638. ISSN 0304-3991

Riedel, C. and Arinero, R. and Tordjeman, Ph. and Ramonda, Michel and Lévêque, G. and Schwartz, G. A. and de Oteyza, D. G. and Alegría, A. and Colmenero, J. Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. (2010) The European Physical Journal Applied Physics, vol. 50 (n° 1). pp. 10501 1-10501 8. ISSN 1286-0042

Riedel, C. and Arinero, Richard and Tordjeman, Philippe and Lévêque, G. and Schwartz, G. A. and Alegria, A. and Colmenero, J. Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy. (2010) Physical Review E, vol. 81 (n° 1). ISSN 1539-3755

Chinaud, Maxime and Delaunay, Thomas and Tordjeman, Philippe An experimental study of particle sedimentation using ultrasonic speckle velocimetry. (2010) Measurement Science and Technology, vol. 21 (n° 5). ISSN 0957-0233

Arinero, R. and Riedel, C. and Schwartz, G.A. and Lévêque, G. and Alegria, A. and Tordjeman, Ph. and Israeloff, N.E. and Ramonda, M. and Colmenero, J. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2

This list was generated on Thu Oct 23 03:09:47 2014 CEST.