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Items where Laboratory is "Institut d'Electronique de Microélectronique et de Nanotechnologie - IEMN (Villeneuve d'Ascq, France)"
Group by: Item Type | No Grouping Number of items: 1. Lampin, E. and Cristiano, F. and Lamrani, Y. and Connétable, Damien Optimisation of the parameters of an extended defect model applied to non-amorphizing implants. (2005) Materials science and engineering B, vol. 124-125 . pp. 397-400. ISSN 0921-5107 |
