OATAO - Open Archive Toulouse Archive Ouverte Open Access Week

Items where Laboratory is "Direction des applications militaires - CEA/DAM (Arpajon, France)"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 18.

Article

Virmontois, Cédric and Goiffon, Vincent and Robbins, Mark S. and Tauziède, Laurie and Geoffray, Hervé and Raine, Mélanie and Girard, Sylvain and Gilard, Olivier and Magnan, Pierre and Bardoux, Alain Dark Current Random Telegraph Signals in Solid-State Image Sensors. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 6). pp. 4323-4331. ISSN 0018-9499

Raine, Mélanie and Goiffon, Vincent and Girard, Sylvain and Rousseau, Adrien and Gaillardin, Marc and Paillet, Philippe and Duhamel, Olivier and Virmontois, Cédric Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 6). pp. 4297-4304. ISSN 0018-9499

Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Leray, Jean-Luc and Goiffon, Vincent and Magnan, Pierre and Marcandella, Claude and Martinez, Martial and Raine, Mélanie and Duhamel, Olivier and Richard, Nicolas and Andrieu, F. and Barraud, S. and Faynot, O. Investigations on the vulnerability of advanced CMOS technologies to MGy dose environments. (2013) IEEE Transactions on Nuclear Science, 60 (4). pp. 2590-2597. ISSN 0018-9499

Gaillardin, Marc and Goiffon, Vincent and Marcandella, Claude and Girard, Sylvain and Martinez, Martial and Paillet, Philippe and Magnan, Pierre and Estribeau, Magali Radiation Effects in CMOS Isolation Oxides: Differences and Similarities With Thermal Oxides. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 4). pp. 2623-2629. ISSN 0018-9499

Girard, Sylvain and Mescia, L. and Vivona, M. and Laurent, A. and Ouerdane, Y. and Marcandella, Claude and Prudenzano, F. and Boukenter, A. and Robin, T. and Paillet, Philippe and Goiffon, Vincent and Gaillardin, Marc and Cadier, B. and Pinsard, E. and Cannas, M. and Boscaino, R. Design of Radiation-Hardened Rare-Earth Doped Amplifiers Through a Coupled Experiment/Simulation Approach. (2013) Journal of Lightwave Technology (JLT), vol. 31 (n° 8). pp. 1247-1254. ISSN 0733-8724

Paillet, Philippe and Goiffon, Vincent and Chabane, Aziouz and Girard, Sylvain and Rousseau, Adrien and Darbon, Stéphane and Duhamel, Olivier and Raine, Mélanie and Cervantes, Paola and Gaillardin, Marc and Bourgade, Jean-Luc and Magnan, Pierre and Glebov, Vladimir Yu and Pien, Gregory Hardening approach to use CMOS image sensors for fusion by inertial confinement diagnostics. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 6). pp. 4349-4355. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Corbière, Franck and Magnan, Pierre and Girard, Sylvain and Bardoux, Alain Displacement Damage Effects in Pinned Photodiode CMOS Image Sensors. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 6). pp. 2872-2877. ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 6). pp. 2878-2887. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Girard, Sylvain and Petit, Sophie and Rolland, Guy and Bardoux, Alain Total ionizing dose versus displacement damage dose induced dark current random telegraph signals in CMOS image sensors. (2011) IEEE Transactions on Nuclear Science, vol. 58 (n° 6). pp. 3085-3094. ISSN 0018-9499

Conference or Workshop Item

Bouzgarrou, Ghazi and Bury, Yannick and Jamme, Stéphane and Joly, Laurent and Haas, Jean-François Experimental determination of the growth rate of Richtmyer-Meshkov induced turbulent mixing after reshock. (2013) In: 29th International Symposium on Shock Waves - ISSW29, 14-19 Jul 2013, Madison, USA .

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects on Pinned Photodiode CMOS Image Sensors: Overview of Pixel Performance Degradation Due to Total Ionizing Dose. (2012) In: Workshop on Radiation Effects in Optoelectronic Detectors, 28 November 2012 - 29 November 2012 (Toulouse, France). (Unpublished)

Rousseau, Adrien and Darbon, Stéphane and Girard, Sylvain and Paillet, Philippe and Bourgade, Jean-Luc and Goiffon, Vincent and Magnan, Pierre and Lalucaa, Valerian and Hamel, Matthieu and Larour, Jean Vulnerability of optical detection systems to megajoule class laser radiative environment. (2012) In: SPIE Photonics Europe, 16 April 2012 - 19 April 2012 (Brussels, Belgium).

Bouzgarrou, Ghazi and Bury, Yannick and Jamme, Stéphane and Haas, Jean-François and Counilh, Denis and Cazalbou, Jean-Bernard Experimental characterization of turbulence produced in a shock tube: a preliminary work for the Study of the turbulent gaseous mixing induced by the Richtmyer-Meshkov instability. (2011) In: 28th International Symposium on Shock Waves, 17-22 July 2011, Manchester, UK .

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Martin-Gonthier, Philippe Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2011) In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain .

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy Influence of Displacement Damage Dose on Dark Current Distribution of Irradiated CMOS Image Sensors. (2011) In: 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2011), 19 September 2011 - 23 September 2011 (Sevilla, Spain).

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Girard, Sylvain and Paillet, Philippe Analysis of Total Dose Induced Dark Current in CMOS Image Sensors from Interface State and Trapped Charge Density Measurements. (2010) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2010), 19 July 2010 - 23 July 2010 (Denver, United States). (Unpublished)

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Inguimbert, Christophe and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Displacement Damage Effect Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Sub-Micron Technology. (2010) In: Nuclear and Space Radiation Effects Conference (NSREC), 19 July 2010 - 23 July 2010 (Denver, United States). (Unpublished)

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy and Bardoux, Alain Influence of displacement damage dose on dark current distributions of irradiated CMOS image sensors. In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain .

This list was generated on Tue Dec 16 16:46:57 2014 CET.