Items where Laboratory is "Direction des applications militaires - CEA/DAM (Arpajon, France)"

Virmontois, Cédric and Goiffon, Vincent and Corbière, Franck and Magnan, Pierre and Girard, Sylvain and Bardoux, Alain Displacement Damage Effects in Pinned Photodiode CMOS Image Sensors. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 6). pp. 2872-2877. ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 6). pp. 2878-2887. ISSN 0018-9499