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Items where Laboratory is "Centro de Fisica e Materiales (San Sebastian, Spain)"

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Article

Riedel, C. and Schwartz, Gustavo Ariel and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Alegría, Angel and Colmenero, Juan Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images. (2010) Ultramicroscopy, vol. 110 (n° 6). pp. 634-638. ISSN 0304-3991

Riedel, C. and Arinero, R. and Tordjeman, Ph. and Ramonda, Michel and Lévêque, G. and Schwartz, G. A. and de Oteyza, D. G. and Alegría, A. and Colmenero, J. Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. (2010) The European Physical Journal Applied Physics, vol. 50 (n° 1). pp. 10501 1-10501 8. ISSN 1286-0042

This list was generated on Tue Nov 26 15:43:46 2013 CET.