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Validation of mechanical damage monitoring on aluminium freestanding thin films using electrical measurements

Fourcade, Thibaut and Broue, Adrien and Dehnnin, Jeremie and Desmarres, Jean-Michel and Seguineau, Cédric and Dalverny, Olivier and Alexis, Joël and Masri, Talal Validation of mechanical damage monitoring on aluminium freestanding thin films using electrical measurements. (2013) Key Engineering Materials, 550. 157-164. ISSN 1013-9826

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Official URL: http://www.scientific.net/KEM.550.157

Abstract

This paper describes a new technique allowing the monitoring of damage in metallic freestanding thin films during micro-tensile test by using electrical characterization. After a presentation of the set-up, results obtained on aluminium thin coatings by using two calculation methods for damage variable are presented and commented.

Item Type:Article
Additional Information:Thanks to Trans Tech Publications Inc. editor. The definitive version is available at : http://www.scientific.net/KEM.550.157
HAL Id:hal-00840574
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:French research institutions > Centre National d'Études Spatiales - CNES (FRANCE)
Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
Other partners > NOVAMEMS (FRANCE)
Laboratory name:
Statistics:download
Deposited By: Olivier Dalverny
Deposited On:17 May 2013 14:21

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