Martin-Gonthier, Philippe and Molina, Romain and Cervantes, Paola and Magnan, Pierre Analysis and Optimization of Noise Response for Low-Noise CMOS Image Sensors. (2012) In: 10th IEEE NEWCAS 2012, 17-20 Jun 2012, Montreal, Canada .
(Document in English)
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Official URL: http://dx.doi.org/10.1109/NEWCAS.2012.6329069
CMOS image sensors are nowadays widely used in imaging applications and particularly in low light flux applications. This is really possible thanks to a reduction of noise obtained, among others, by the use of pinned photodiode associated with a Correlated Double Sampling readout. It reveals new noise sources which become the major contributors. This paper presents noise measurements on low-noise CMOS image sensor. Image sensor noise is analyzed and optimization is done in order to reach an input referred noise of 1 electron rms by column gain amplifier insertion and dark current noise optimization. Pixel array noise histograms are analyzed to determine noise impact of dark current and column gain amplifier insertion. Transfer noise impact, due to the use of pinned photodiode (4T photodiode), is also measured and analyzed by a specific readout sequence.
|Item Type:||Conference or Workshop Item (Paper)|
|Audience (conference):||International conference proceedings|
|Institution:||Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE (FRANCE)|
Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Conception d’Imageurs Matriciels Intégrés - CIMI
|Deposited By:||Philippe MARTIN-GONTHIER|
|Deposited On:||27 Nov 2012 11:16|
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