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Optoelectrical performance evolution of CMOS image sensors exposed to gamma radiation

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre Optoelectrical performance evolution of CMOS image sensors exposed to gamma radiation. (2009) In: International Image Sensor Workshop, 25-28 June 2009, Bergen, Norway .

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Official URL: http://www.imagesensors.org/Past%20Workshops/2009%20Workshop/2009%20Papers/2009%20IISW%20Program.htm

Abstract

In this paper we present a study of ionizing radiation effects, up to 5 kGy, in several CMOS image sensors manufactured using a commercial 0.18 μm technology dedicated to imaging.

Item Type:Conference or Workshop Item (Paper)
Audience (conference):International conference proceedings
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Institution: Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE
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Deposited By: Vincent Goiffon
Deposited On:28 Nov 2011 14:08

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