Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre Optoelectrical performance evolution of CMOS image sensors exposed to gamma radiation. (2009) In: International Image Sensor Workshop, 25-28 June 2009, Bergen, Norway.
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Official URL: http://www.imagesensors.org/Past%20Workshops/2009%20Workshop/2009%20Papers/2009%20IISW%20Program.htm
Abstract
In this paper we present a study of ionizing radiation effects, up to 5 kGy, in several CMOS image sensors manufactured using a commercial 0.18 μm technology dedicated to imaging.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Audience (conference): | International conference proceedings |
| Uncontrolled Keywords: | |
| Institution: | Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE |
| Laboratory name: | Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Image Sensor Research Team |
| Statistics: | download |
| Deposited By: | Vincent Goiffon |
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