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Spectral behavior of long wavelength VCSELs

Bacou, Alexandre and Rissons, Angélique and Mollier, Jean-Claude Spectral behavior of long wavelength VCSELs. (2008) In: SPIE Photonics West, 19-24 Jan 2008, San Jose, United States .

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Official URL: http://dx.doi.org/10.1117/12.763054

Abstract

For a long time, only a small wavelength range of Vertical-Cavity Surface-Emitting Lasers (VCSEL) was available. The current evolution in process technology allows the fabrication of long wavelength VCSEL that is interesting for Telecom systems because they offer a higher integration level than the existing optical sources at lower costs since they are fabricated in arrays. We propose to focus our investigation on the behavior of singlemode 1.55μm VCSEL. We aim at precisely knowing their spectral properties under direct modulation. We present a study about the linewidth measurement and the linewidth enhancement factor, also called the Henry - or the alpha - factor. Many studies have been reported but only a few of them are really efficient. Two different set-ups are presented here to extract alpha factor. The first one uses an interferometer based on the heterodyne technique and the second uses the dispersive properties of an optical fiber. We compare both results and discuss about each set-up.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Proceeding of SPIE Vol. 6908
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution: Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE
Laboratory name:
Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Micro-ondes et Optique pour Systèmes Embarqués - MOSE
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Deposited By: Angelique Rissons
Deposited On:05 Jun 2008 13:09

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