Martin-Gonthier, Philippe and Magnan, Pierre Low-frequency noise impact on CMOS image sensors. (2009) In: 24th Conference on Design of Circuits and Integrated Systems - DCIS’09, 18-20 Nov 2009, Zaragoza, Spain.
|(Document in English) |
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CMOS image sensors are nowadays extensively used in imaging applications even for high-end applications. This is really possible thanks to a reduction of noise obtained, among others, by Correlated Double Sampling (CDS) readout. Random Telegraph Signal (RTS) noise has thus become an issue for low light level applications especially in the context of downscaling transistor size. This paper describes the analysis of in-pixel source follower transistor RTS noise filtering by CDS circuit. The measurement of a non Gaussian distribution with a positive skew of image sensor output noise is analysed. Impact of dimensions (W and L) of the in-pixel source follower is demonstrated. Circuit to circuit pixel output noise dispersion on 12 circuits coming from 3 different wafers is also analysed and weak dispersion is seen.
|Item Type:||Conference or Workshop Item (Paper)|
|Audience (conference):||International conference proceedings|
|Institution:||Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE|
Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Conception d’Imageurs Matriciels Intégrés - CIMI
|Deposited By:||Philippe MARTIN-GONTHIER|
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