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Efficient optoelectronic de-embedding for VCSEL intrinsic response extraction

Bacou, Alexandre and Hayat, Ahmad and Rissons, Angélique and Mollier, Jean-Claude and Lakovlev, Vladimir and Sirbu, Alexei and Kapon, Eli Efficient optoelectronic de-embedding for VCSEL intrinsic response extraction. (2010) In: International Topical Meeting on Microwave Photonics, 14-16 Oct 2009, Valencia, Spain .

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Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5342669

Abstract

In this present work, we propose a new method to remove the parasitics contribution to the VCSEL chip response,in order to obtain the intrinsic transmission behavior. It has been observed that the S11 reflection coefficient of the chip is only due to the electrical access to the chip composed by the transmission line and cavity contacts. This allows us to decompose the chip into two cascaded subsystems representing the electrical access and the optical cavity respectively. An equivalent electrical circuit is developed for the electrical access behavior and, combined with the transfer matrix formalism, it becomes possible to remove the parasitics contribution from the measured S21 response. In this way, the intrinsic 3-dB bandwidth of the VCSEL can be determined.

Item Type:Conference or Workshop Item (Lecture)
Additional Information:Thanks to the Institute of Electrical and Electronics Engineers (IEEE). The original PDF can be found on the IEEE website: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5342669
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution: Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE
Other partners > Ecole Polytechnique Fédérale de Lausanne - EPFL (SWITZERLAND)
Laboratory name:
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Deposited By:Angelique Rissons

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