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Study of degradation mechanisms of black anodic films in simulated space environment

Goueffon, Yann and Monjauze, Muguette and Mabru, Catherine and Arurault, Laurent and Tonon, Claire and Guigue, Pascale Study of degradation mechanisms of black anodic films in simulated space environment. (2009) In: 11th International Symposium on Materials in Space Environment, 15-18 Sept 2009, Aix-en-Provence, France .

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Black anodic films are used on aluminium alloys in space applications to provide specific thermo-optical properties to the surface. During the process, thermal and/or residual stresses can lead to crazing of the film in particular conditions. After thermal cycling performed to simulate the space environment, cases of film flaking have been observed. This constitutes potential risks for the satellite lifetime. Peel-test and scratch-test have been used to evaluate the evolution of the adhesion during ageing. For example, we showed that this phenomenon is due to crack propagation occurring at the beginning of ageing. A finite element model has then been developed to study more accurately the propagation mode of these cracks. Thermal stresses are likely to propagate cracks through the film in pure opening mode. When cracks are long enough, thermal stresses can generate propagation parallel to the interface. This would result in the decrease of the measured adhesion with a possibility of flaking.

Item Type:Conference or Workshop Item (Lecture)
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
French research institutions > Centre National des Etudes Spatiales - CNES (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UPS (FRANCE)
French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Laboratory name:
Deposited By: Catherine Mabru
Deposited On:10 Sep 2009 09:05

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