Hopkinson, Gordon R. and Goiffon, Vincent and Mohammadzadeh, Ali Random telegraph signals in proton irradiated CCDs and APS. (2008) IEEE Transactions on Nuclear Science, vol. (n° 4). pp. 2197-2204. ISSN 0018-9499
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| (Document in English) PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader 626Kb |
Official URL: http://dx.doi.org/10.1109/TNS.2008.2000764
Abstract
Random telegraph dark signal fluctuations have been studied in two types of CCD and two types of CMOS active pixel sensor after proton irradiation at 1.5, 10 and 60 MeV. Time constants and activation energies were very similar, indicating a similar defect type. A large fraction of the defects are multi- rather than 2-level, suggesting a mechanism related to defect clusters being formed from initial single proton events.
| Item Type: | Article |
|---|---|
| Additional Information: | Thanks to the Institute of Electrical and Electronics Engineers (IEEE).The original PDF can be found on the IEEE website : http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4636913&tag=1 |
| Audience (journal): | International peer-reviewed journal |
| Uncontrolled Keywords: | |
| Institution: | Other partners > European Space Agency - ESA (UK) Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE Other partners > Surrey Satellite Technology (UK) |
| Laboratory name: | Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Conception d’Imageurs Matriciels Intégrés - CIMI |
| Statistics: | download |
| Deposited By: | Vincent Goiffon |
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