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Contribution to modeling of parasitic couplings for predicting EMC behavior of electrical machines

Ramos Chavez, Jose Ioav and Diénot, Jean-Marc and Vidal, Paul-Etienne and Viguier, Christophe and Nogarède, Bertrand Contribution to modeling of parasitic couplings for predicting EMC behavior of electrical machines. (2014) In: 2014 International Conference on Electrical Machines (ICEM), 2 September 2014 - 5 September 2014 (Berlin, Germany).

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Official URL: https://doi.org/10.1109/ICELMACH.2014.6960312

Abstract

The characterization of parasitic couplings contributing to mechatronic assemblies’ wide band Electromagnetic Compatibility (EMC) behavior is complex but increasingly essential for meeting needed performance and regulations. This article presents a comparative study of analytical and numerical approaches to determine the capacitive couplings in wound structures as an effort to develop a comprehensive approach to predict and prevent undesired couplings. The approach is based on physical and structural parameters analysis instead of behavioral characterization, allowing the use of predictive tools in the early design stage of mechatronic systems. The analytical model presented is compared to simulation methods applied to a three-layer inductor. Calculations converge to similar results. In the last part of the work, an experimental measurement of stray capacitance is done on an actual stator winding and compared to the analytical predictions of parasitic capacitances.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to IEEE. The original document is available on iEEE Xplore: https://doi.org/10.1109/ICELMACH.2014.6960312. © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
HAL Id:hal-02135802
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UPS (FRANCE)
Other partners > NOVATEM (FRANCE)
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Funders:
Novatem SAS
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Deposited By: Paul-Etienne Vidal
Deposited On:16 May 2019 13:25

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