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Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor

Allanche, Timothé and Goiffon, Vincent and Rizzolo, Serena and Paillet, Philippe and Chabane, Aziouz and Duhamel, Olivier and Muller, Cyprien and Magnan, Pierre and Clerc, Raphael and Marin, Emmanuel and Boukenter, Aziz and Ouerdane, Youcef and Girard, Sylvain Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor. (2017) In: Radiation and Its Effects on Components and Systems (RADECS 2017), 2 October 2017 - 6 October 2017 (Genève, Switzerland).

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Abstract

Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor.

Item Type:Conference or Workshop Item (Poster)
Audience (conference):International conference without published proceedings
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Institution:Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited By: Serena Rizzolo
Deposited On:05 Mar 2019 13:55

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