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Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Goiffon, Vincent Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions. (2018) In: CNES Workshop: Radiation Effects on Optoelectronic Detectors, 27 November 2018 (Toulouse, France). (Unpublished)

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Abstract

Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions.

Item Type:Conference or Workshop Item (Other)
Audience (conference):National conference without published proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National d'Études Spatiales - CNES (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited By: Alexandre Le Roch
Deposited On:30 Apr 2019 13:58

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