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Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications

Le Roch, Alexandre and Virmontois, Cédric and Goiffon, Vincent and Tauziède, Laurie and Belloir, Jean-Marc and Durnez, Clémentine and Magnan, Pierre Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications. (2018) IEEE Transactions on Nuclear Science, 65 (8). 1645-1653. ISSN 0018-9499

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Official URL: https://doi.org/10.1109/TNS.2018.2820385

Abstract

We propose to identify the displacement damage defects induced by proton and carbon irradiations in a commercial off-the-shelf pinned photodiode (PPD) 8T-CMOS image sensors (CISs) dedicated to space application operating in global shutter mode. This paper aims to provide a better understanding of defects creation in a specific space image sensor. Therefore, it leads to comparable results to those we could find during the mission. The study focuses on bulk defects located in the PPD depleted region which represents the main dark current contribution in PPD CIS. Four sensors have been irradiated with carbon ions and protons at different energies and fluencies. Using both the dark current spectroscopy and the random telegraph signal (RTS) analysis, we investigate defects behavior for different isochronal annealing temperatures. By combining these results, we make the connection between two complementary phenomena and bring out the prevalence of divacancies-based defects in term of dark current contribution.

Item Type:Article
Additional Information:Thanks to the IEEE (Institute of Electrical and Electronics Engineers). This paper is available at : https://ieeexplore.ieee.org/document/8327608 “© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Audience (journal):International peer-reviewed journal
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Institution:French research institutions > Centre National d'Études Spatiales - CNES (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited By: Alexandre Le Roch
Deposited On:22 Mar 2019 12:09

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