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Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies

Rousselin, Thomas and Hubert, Guillaume and Régis, Didier and Gatti, Marc and Bensoussan, Alain Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. (2017) Microelectronics Reliability, 76-77. 159-163. ISSN 0026-2714

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Official URL: https://doi.org/10.1016/j.microrel.2017.07.078

Abstract

This paper evaluates the impact of aging on the radiation sensitivity of 6T SRAMfor two planar bulk technologies. This study ismotivated by the growing impact of aging and radiation effects on the reliability of CMOS technology. Amodelling methodology dedicated to this newphenomenon is proposed. Thismodelling uses the radiation modelling device MUSCA SEP3 and an electrical aging modelling. First, the impact of aging on SEE sensitivity is studied through a parametric modeling of the threshold voltages of the transistors composing the 6T SRAM. Then, an operative avionics environment is modelled in order to evaluate the consequences on reliability.

Item Type:Article
Additional Information:Thanks to Elsevier editor. The definitive version is available at http://www.sciencedirect.com The original PDF of the article can be found at : http://www.sciencedirect.com/science/article/pii/S0026271417303621
HAL Id:hal-01622280
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:French research institutions > Office National d'Etudes et Recherches Aérospatiales - ONERA (FRANCE)
Other partners > Thales (FRANCE)
Other partners > IRT Saint Exupéry - Institut de Recherche Technologique (FRANCE)
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Deposited By: Marie-Pierre Le Tallec
Deposited On:24 Oct 2017 09:40

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