OATAO - Open Archive Toulouse Archive Ouverte Open Access Week

Validation of a model for Dark Current Non Uniformity generated by Displacement Damage Dose in irradiated CMOS Image Sensors

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe Validation of a model for Dark Current Non Uniformity generated by Displacement Damage Dose in irradiated CMOS Image Sensors. (2014) In: Workshop CNES : Radiation Effects on Optoelectronic Devices, 27 November 2014 (Toulouse, France). (Unpublished)

[img]
Preview
(Document in English)

PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
1MB

Abstract

Validation of a model for Dark Current Non Uniformity generated by Displacement Damage Dose in irradiated CMOS Image Sensors.

Item Type:Conference or Workshop Item (Speech)
Audience (conference):National conference without published proceedings
Uncontrolled Keywords:
Institution:French research institutions > Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE)
French research institutions > Centre National des Etudes Spatiales - CNES (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Laboratory name:
Statistics:download
Deposited By: Jean-Marc Belloir
Deposited On:31 Jan 2017 16:24

Repository Staff Only: item control page