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Bayesian estimation of the multifractality parameter for images via a closed-form Whittle likelihood

Combrexelle, Sébastien and Wendt, Herwig and Tourneret, Jean-Yves and Abry, Patrice and Mclaughlin, Stephen Bayesian estimation of the multifractality parameter for images via a closed-form Whittle likelihood. (2015) In: 23rd European Signal Processing Conference (EUSIPCO 2015), 31 August 2015 - 4 September 2015 (Nice, France).

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Official URL: http://dx.doi.org/10.1109/EUSIPCO.2015.7362534

Abstract

Texture analysis is central in many image processing problems. It can be conducted by studying the local regularity fluctuations of image amplitudes, and multifractal analysis provides a theoretical and practical framework for such a characterization. Yet, due to the non Gaussian nature and intricate dependence structure of multifractal models, accurate parameter estimation is challenging: standard estimators yield modest performance, and alternative (semi-)parametric estimators exhibit prohibitive computational cost for large images. This present contribution addresses these difficulties and proposes a Bayesian procedure for the estimation of the multifractality parameter c2 for images. It relies on a recently proposed semi-parametric model for the multivariate statistics of log-wavelet leaders and on a Whittle approximation that enables its numerical evaluation. The key result is a closed-form expression for the Whittle likelihood. Numerical simulations indicate the excellent performance of the method, significantly improving estimation performance over standard estimators and computational efficiency over previously proposed Bayesian estimators.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to IEEE editor. The definitive version is available at http://ieeexplore.ieee.org This papers appears in Proceedings of EUSIPCO 2015. Electronic ISBN: 978-0-9928-6263-3 ISSN: 2076-1465 The original PDF of the article can be found at: http://ieeexplore.ieee.org/document/7362534/ Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
HAL Id:hal-01511893
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Other partners > Ecole Normale Supérieure de Lyon - ENS de Lyon (FRANCE)
Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UPS (FRANCE)
Université de Toulouse > Université Toulouse - Jean Jaurès - UT2J (FRANCE)
Université de Toulouse > Université Toulouse 1 Capitole - UT1 (FRANCE)
Other partners > Université Claude Bernard-Lyon I - UCBL (FRANCE)
Other partners > Heriot-Watt University (UNITED KINGDOM)
Laboratory name:
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Deposited By: IRIT IRIT
Deposited On:22 Mar 2017 11:21

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