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Hidden Markov Model Based Automated Fault Localization for Integration Testing

Ge, Ning and Nakajima, Shin and Pantel, Marc Hidden Markov Model Based Automated Fault Localization for Integration Testing. (2013) In: 4th International Conference on Software Engineering and Service Science (ICSESS 2013), 23 May 2013 - 25 May 2013 (Beijing, China).

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Official URL: http://dx.doi.org/10.1109/ICSESS.2013.6615284

Abstract

Integration testing is an expensive activity in software testing, especially for fault localization in complex systems. Model-based diagnosis (MBD) provides various benefits in terms of scalability and robustness. In this work, we propose a novel MBD approach for the automated fault localization in integration testing. Our method is based on Hidden Markov Model (HMM) which is an abstraction of system's component to simulate component's behaviour. The core of this method is a fault localization algorithm that gives out the set of suspect faulty components and a backward algorithm that calculates the matching degree between the HMM and the real system to evaluate the confidence degree of the localization conclusion. The proposed method is evaluated on a specific test bed and is applied to a simple helicopter control system case study.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to IEEE editor. The definitive version is available at http://ieeexplore.ieee.org This paper appears in : Software Engineering and Service Science (ICSESS), 2013 4th IEEE International Conference on. ISBN 978-1-4673-4997-0. The original PDF of the article can be found at: http://ieeexplore.ieee.org/document/6615284/ Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
HAL Id:hal-01402565
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UPS (FRANCE)
Université de Toulouse > Université Toulouse - Jean Jaurès - UT2J (FRANCE)
Université de Toulouse > Université Toulouse 1 Capitole - UT1 (FRANCE)
Other partners > National Institute of Informatics - NII (JAPAN)
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Deposited By: IRIT IRIT
Deposited On:17 Nov 2016 14:27

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