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Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors

Virmontois, Cédric and Toulemont, Arthur and Rolland, Guy and Materne, Alex and Lalucaa, Valerian and Goiffon, Vincent and Codreanu, Catalin and Durnez, Clémentine and Bardoux, Alain Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors. (2014) IEEE Transactions on Nuclear Science, 61 (6). 3331-3340. ISSN 0018-9499

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Official URL: http://dx.doi.org/10.1109/TNS.2014.2369436

Abstract

This paper focuses on radiation-induced dose and single event effects in digital CMOS image sensors using pinned photodiodes. Proton irradiations were used to study cumulative effects. As previously observed, the dark current is the main electrical parameter affected by protons. The mean dark current increase appears proportional to Srour's universal damage factor. Therefore, the degradation is mainly attributed to displacement damage in the pinned photodiode. Heavy ion tests are also reported in this work. This study focuses on single event effects in digital CMOS imagers using numerous electronic functions such as column ADCs, a state machine and registers. Single event transients, upsets and latchups are observed and analyzed. The cross sections of these single events are transposed to specific space imaging missions in order to show that the digital functions can fit the mission requirements despite these perturbations.

Item Type:Article
Additional Information:Thanks to IEEE Xplore editor. The definitive version is available at http://ieeexplore.ieee.org The original PDF of the article can be found at IEEE Transactions on Nuclear Science website : http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6969835
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:French research institutions > Centre National d'Études Spatiales - CNES (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited By: Vincent Goiffon
Deposited On:16 Dec 2015 10:37

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