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Pixel Pitch and Particle Energy Influence on the Dark Current Distribution of Neutron Irradiated CMOS Image Sensors

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe and Duhamel, Olivier and Gaillardin, Marc Pixel Pitch and Particle Energy Influence on the Dark Current Distribution of Neutron Irradiated CMOS Image Sensors. (2015) In: IEEE Nuclear & Space Radiation Effects Conference (NSREC 2015), 13 July 2015 - 17 July 2015 (Boston, United States).

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Abstract

An existing empirical model for the prediction of radiation-induced dark current increase generated by displacement damage dose is validated much further. It is tested on 34 CIS pixel arrays with different pixel types and pixel pitches, irradiated at various displacement damage doses and neutron energies. The model can accurately reproduce all the dark current distributions regardless of the pixel type, pixel pitch and dose, and depends only on the neutron energy. It is shown that the mean damage energy of elastic nuclear interactions decreases at lower neutron energies, and is most likely responsible for the energy dependence of the model. This model can be used to calculate, with a simple formula and without any physical calculations or simulations, the radiation-induced DCNU in CIS generated by nuclear scattering, which is the dominant DCNU source for both high-energy protons in space and neutrons in nuclear environment.

Item Type:Conference or Workshop Item (Speech)
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE)
French research institutions > Centre National d'Études Spatiales - CNES (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited By: Jean-Marc Belloir
Deposited On:10 Dec 2015 15:21

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