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A Model-based Repository of Security and Dependability Patterns for Trusted RCES

Ziani, Adel and Hamid, Brahim and Geisel, Jacob and Bruel, Jean-Michel A Model-based Repository of Security and Dependability Patterns for Trusted RCES. (2013) In: IEEE International Conference on Information Reuse and Integration (IRI), 14 August 2013 - 16 August 2013 (San Francisco, United States).

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Official URL: http://dx.doi.org/10.1109/IRI.2013.6642505

Abstract

The requirement for higher Security and Dependability (S&D) of systems is continuously increasing, even in domains traditionally not deeply involved in such issues. Nowadays, many practitioners express their worries about current S&D software engineering practices. New recommendations should be considered to ground this discipline on two pillars: solid theory and proven principles. We took the second pillar towards software engineering for embedded system applications, focusing on the problem of integrating S&D by design to foster reuse. Model driven approaches combined with patterns can be extremely helpful to deal with these strong requirements. In this work, we present a framework for trusted Resource Constrained Embedded Systems (RCES) development by design, by defining both a model to represent S&D pattern language and an architecture for development tools. The implementation of a repository of S&D patterns and their complementary property models is discussed in detail.

Item Type:Conference or Workshop Item (Paper)
HAL Id:hal-01146705
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UPS (FRANCE)
Université de Toulouse > Université Toulouse - Jean Jaurès - UT2J (FRANCE)
Université de Toulouse > Université Toulouse 1 Capitole - UT1 (FRANCE)
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Deposited By: IRIT IRIT
Deposited On:27 Apr 2015 14:20

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