OATAO - Open Archive Toulouse Archive Ouverte Open Access Week

Pixel Level Characterization of Pinned Photodiode and Transfer Gate Physical Parameters in CMOS Image Sensors

Goiffon, Vincent and Estribeau, Magali and Michelot, Julien and Cervantes, Paola and Pelamatti, Alice and Marcelot, Olivier and Magnan, Pierre Pixel Level Characterization of Pinned Photodiode and Transfer Gate Physical Parameters in CMOS Image Sensors. (2014) IEEE Journal of the Electron Devices Society, 2 (4). 65-76. ISSN 2168-6734

[img]
Preview
(Document in English)

PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
516kB

Official URL: http://dx.doi.org/10.1109/JEDS.2014.2326299

Abstract

A method to extract the pinned photodiode (PPD) physical parameters inside a CMOS image sensor pixel array is presented. The proposed technique is based on the Tan et al. pinning voltage characteristic. This pixel device characterization can be performed directly at the solid-state circuit output without the need of any external test structure. The presented study analyzes the different injection mechanisms involved in the different regimes of the characteristic. It is demonstrated that in addition to the pinning voltage, this fast measurement can be used to retrieve the PPD capacitance, the pixel Equilibrium Full Well Capacity (EFWC) and both the Transfer Gate (TG) threshold voltage and its channel potential at a given gate voltage. An alternative approach is also proposed to extract an objective pinning voltage value from this measurement.

Item Type:Article
Additional Information:Thanks to IEEE editor. (c) 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. The definitive version is available at http://ieeexplore.ieee.org
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Other partners > Pyxalis (FRANCE)
Laboratory name:
Statistics:download
Deposited By: Vincent Goiffon
Deposited On:13 Jun 2014 13:34

Repository Staff Only: item control page