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Single Event Effects in 4T and 5T Pinned Photodiode CMOS Image Sensors

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Rolland, Guy and Petit, Sophie Single Event Effects in 4T and 5T Pinned Photodiode CMOS Image Sensors. (2013) In: 3rd Workshop on CMOS Image Sensors for High Performance Applications, 26 November 2013 - 27 November 2013 (Toulouse, France). (Unpublished)

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Abstract

Single Event Effects in 4T and 5T Pinned Photodiode CMOS Image Sensors

Item Type:Conference or Workshop Item (Other)
Audience (conference):National conference without published proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National des Etudes Spatiales - CNES (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Laboratory name:
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Deposited By: Vincent Goiffon
Deposited On:06 Jan 2015 13:50

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