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Single Event Effects in 4T Pinned Photodiode Image Sensors

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Rolland, Guy and Petit, Sophie Single Event Effects in 4T Pinned Photodiode Image Sensors. (2013) In: 50th IEEE Nuclear and Space Radiation Effects Conference (NSREC), 8 July 2013 - 12 July 2013 (San Francisco, United States).

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Abstract

Presentation on the Single Event Effects (SEEs) in 4T Pinned Photodiode Image Sensors when they are exposed to a heavy ion flux.

Item Type:Conference or Workshop Item (Speech)
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National des Etudes Spatiales - CNES (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Laboratory name:
Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Conception d’Imageurs Matriciels Intégrés - CIMI
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Deposited By: Valerian Lalucaa
Deposited On:15 Apr 2014 15:14

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