OATAO - Open Archive Toulouse Archive Ouverte Open Access Week

Radiation Effects on Pinned Photodiode CMOS Image Sensors: Overview of Pixel Performance Degradation Due to Total Ionizing Dose

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects on Pinned Photodiode CMOS Image Sensors: Overview of Pixel Performance Degradation Due to Total Ionizing Dose. (2012) In: Workshop on Radiation Effects in Optoelectronic Detectors, 28 November 2012 - 29 November 2012 (Toulouse, France). (Unpublished)

[img] (Document in English)

PDF (Author's version) - Depositor and staff only - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
2MB

Abstract

Several Pinned Photodiode (PPD) CMOS Image Sensors (CIS) are designed, manufactured, characterized and exposed biased to ionizing radiation up to 1Mrad(SiO2). In addition to the usually reported dark current increase and quantum efficiency drop at short wavelengths, several original radiation effects are shown: an increase of the pinning voltage, a decrease of the buried photodiode full well capacity, a large change in charge transfer efficiency, the creation of a large number of Total Ionizing Dose (TID) induced Dark Current Random Telegraph Signal (DC-RTS) centers active in the photodiode (even when the Transfer Gate (TG) is accumulated) and the complete depletion of the Pre-Metal Dielectric (PMD) interface at the highest TID leading to a large dark current and the loss of control of the TG on the dark current. The proposed mechanisms at the origin of these degradations are discussed. It is also demonstrated that biasing (i.e. operating) the PPD CIS during irradiation does not enhance the degradations compared to sensors grounded during irradiation.

Item Type:Conference or Workshop Item (Other)
Audience (conference):National conference without published proceedings
Uncontrolled Keywords:
Institution:French research institutions > Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Laboratory name:
Statistics:download
Deposited By: Vincent Goiffon
Deposited On:19 Sep 2014 13:31

Repository Staff Only: item control page