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Investigations on the vulnerability of advanced CMOS technologies to MGy dose environments

Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Leray, Jean-Luc and Goiffon, Vincent and Magnan, Pierre and Marcandella, Claude and Martinez, Martial and Raine, Mélanie and Duhamel, Olivier and Richard, Nicolas and Andrieu, F. and Barraud, S. and Faynot, O. Investigations on the vulnerability of advanced CMOS technologies to MGy dose environments. (2013) IEEE Transactions on Nuclear Science, 60 (4). pp. 2590-2597. ISSN 0018-9499

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Official URL: http://dx.doi.org/10.1109/TNS.2013.2249095

Abstract

This paper investigates the TID sensitivity of silicon-based technologies at several MGy irradiation doses to evaluate their potential for high TID-hardened circuits. Such circuits will be used in several specific applications suc as safety systems of current or future nuclear power plants considering various radiation environments including normal and accidental operating conditions, high energy physics instruments, fusion experiments or deep space missions. Various device designs implemented in well established bulk silicon and Partially Depleted SOI technologies are studied here up to 3 MGy. Furthermore, new insights are given on the vulnerability of more advanced technologies including planar Fully Depleted SOI and multiple-gate SOI transistors at such high dose. Potential of tested technologies are compared and discussed for stand-alone integrated circuits.

Item Type:Article
Additional Information:Thanks to IEEE editor. The original PDF of the article can be found at IEEE website : http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6494703
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:French research institutions > Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Other partners > MINATEC (FRANCE)
Other partners > Université Jean Monnet - St Etienne (FRANCE)
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Deposited By: Vincent Goiffon
Deposited On:23 Jul 2014 14:48

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