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Displacement Damage Effect Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Sub-Micron Technology

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Inguimbert, Christophe and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Displacement Damage Effect Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Sub-Micron Technology. (2010) In: Nuclear and Space Radiation Effects Conference (NSREC), 19 July 2010 - 23 July 2010 (Denver, United States). (Unpublished)

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Abstract

Displacement damage effects due to proton and neutron irradiations of CMOS image sensors dedicated to imaging are presented through the analysis of the dark current behavior in pixel arrays and isolated photodiodes. The mean dark current increase and the dark current non-uniformity are investigated. Dark current histogram observations are compared to damage energy distributions based on GEANT 4 calculations. We also discuss, through annealing analysis, which defects could be responsible for the dark current in CMOS image sensors.

Item Type:Conference or Workshop Item (Poster)
Audience (conference):International conference without published proceedings
Uncontrolled Keywords:
Institution:French research institutions > Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE)
French research institutions > Centre National d'Études Spatiales - CNES (FRANCE)
Other partners > EADS - Astrium (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
French research institutions > Office National d'Etudes et Recherches Aérospatiales - ONERA (FRANCE)
Laboratory name:
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Deposited By: Vincent Goiffon
Deposited On:30 Sep 2014 14:23

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