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Ionization Effects in CMOS Imagers

Magnan, Pierre and Goiffon, Vincent Ionization Effects in CMOS Imagers. (2010) In: Fraunhofer IMS Workshop on CMOS Imaging, 4 May 2010 - 5 May 2010 (Duisburg, Germany). (Unpublished)

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Abstract

Ionization Effects in CMOS Imagers

Item Type:Conference or Workshop Item (Other)
Audience (conference):International conference without published proceedings
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Institution:Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited By: Vincent Goiffon
Deposited On:23 Sep 2014 14:45

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