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Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior Analysis

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior Analysis. (2008) In: Nuclear and Space Radiation Effects Conference (NSREC), 14 July 2008 - 18 July 2008 (Tucson, United States). (Unpublished)

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Abstract

Ionizing radiation effects on CMOS image sensors implemented in 0.18 µm imaging technology are presented through the analysis of the behaviour of both elementary devices such as photodiodes, gated diodes, MOSFETs and also pixel array

Item Type:Conference or Workshop Item (Other)
Audience (conference):International conference without published proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National des Etudes Spatiales - CNES (FRANCE)
Other partners > EADS - Astrium (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited By: Vincent Goiffon
Deposited On:23 Sep 2014 09:41

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