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Towards a reliability analysis method of wide band gap power electronic components and modules

Parent, Guillaume and Massiot, Gregor and Rouet, Vincent and Munier, Catherine and Vidal, Paul-Etienne and Carrillo, Francisco Javier Towards a reliability analysis method of wide band gap power electronic components and modules. (2013) In: European Microelectronics and Packaging Conference , 9 September 2013 - 12 September 2013 (Grenoble, France).

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Abstract

This study is addressing on the reliability of COTS (Commercial Off-The-Shelf) power electronic components and modules which could be used in high reliability systems such as aerospace systems. This paper details the first followed steps to achieve a reliability assessment of some COTS power devices. These first steps are: - Construction analyses for the determination of the packaging assembly technologies of COTS power devices; - Discussion on the material used in COTS power devices; - Synthesis of the potential failure risk analysis under harsh environments; - Determination of several accelerated ageing tests to check the potential failure modes and mechanisms in power electronic for aerospace systems.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to IEEE Xplore editor. The definitive version is available at : http://ieeexplore.ieee.org/Xplore/home.jsp
HAL Id:hal-00952707
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
Other partners > European Aeronautic Defence and Space company - EADS (FRANCE)
Laboratory name:
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Deposited By: Francisco Carrillo
Deposited On:07 Feb 2014 15:43

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