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Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy

Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Schwartz, Gustavo Ariel and Alegría, Angel and Colmenero, Juan Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy. (2010) Physical Review E, 81 (1). ISSN 1539-3755

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Official URL: http://dx.doi.org/10.1103/PhysRevE.81.010801

Abstract

We present a simple method to quantitatively image the dielectric permittivity of soft materials at nanoscale using electrostatic force microscopy (EFM) by means of the double pass method. The EFM experiments are based on the measurement of the frequency shifts of the oscillating tip biased at two different voltages. A numerical treatment based on the equivalent charge method allows extracting the values of the dielectric permittivity at each image point. This method can be applied with no restrictions of film thickness and tip radius. This method has been applied to image the morphology and the nanodielectric properties of a model polymer blend of polystyrene and poly(vinyl acetate).

Item Type:Article
Additional Information:Thanks to American Physical Society editor. The original PDF of the article can be found at Physical Review E website : http://pre.aps.org/
HAL Id:hal-00909186
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Other partners > Donostia International Physics Center - DIPC (SPAIN)
Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UPS (FRANCE)
Other partners > Universidad del País Vasco - Euskal Herriko Unibertsitatea - EHU (SPAIN)
Other partners > Université de Montpellier 2 (FRANCE)
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Deposited By: Philippe TORDJEMAN
Deposited On:26 Nov 2013 08:07

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